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First-Principles Nanocapacitor Simulations of the Optical Dielectric Constant in Water Ice
Anthony Mannino1,2, Graciele M Arvelos3, Kedarsh Kaushik1,2
1Stony Brook University, Physics and Astronomy Department, Stony Brook, New York 11794-3800, USA.
Physical Review Letters
|January 30, 2026
Summary
We developed a new method to accurately measure nanocapacitor dielectric response. This framework resolves charge partitioning issues, revealing confinement does not alter crystalline ice
Area of Science:
- Condensed matter physics
- Materials science
- Computational chemistry
Background:
- Conventional capacitance measurements at the nanoscale are complicated by ambiguous charge partitioning between electrodes and dielectrics.
- This ambiguity affects the accurate determination of dielectric properties and introduces spurious interfacial effects.
Purpose of the Study:
- To develop a robust computational framework for accurately calculating nanocapacitor capacitance and dielectric response.
- To address the challenges of charge partitioning in nanoscale systems.
- To investigate the dielectric properties of subnanometer dielectrics, specifically crystalline ice, under bias.
Main Methods:
- Combined density functional theory (DFT) and nonequilibrium Green's function (NEGF) framework.
- Development of a novel charge-separation protocol to resolve electrode and dielectric contributions.
- Analysis of crystalline ice as a model subnanometer dielectric material.
Main Results:
- The new framework accurately computes capacitance and extracts dielectric response, overcoming ill-posed charge partitioning issues.
- The robust charge-separation protocol yields unique capacitance-derived polarizability and dielectric constants for crystalline ice.
- Demonstrated that nanoscale confinement does not alter the intrinsic electronic response or proton order insensitivity of crystalline ice.
Conclusions:
- The developed DFT-NEGF framework provides a rigorous approach for interpreting capacitance measurements in low-dimensional dielectric materials.
- This work establishes a foundation for understanding dielectric behavior in nanoscale devices.
- Highlights the importance of accurate charge partitioning for reliable nanoscale dielectric characterization.
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