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Related Experiment Video

Updated: Feb 8, 2026

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
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High-Speed Integral Off-Resonance Atomic Force Microscope.

Kaixuan Wang1,2, Jialin Shi1, Peng Yu1

  • 1State Key Laboratory of Robotics and Intelligent Systems, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, China.

Nano Letters
|February 7, 2026
PubMed
Summary
This summary is machine-generated.

Scientists developed integral off-resonance tapping (I-ORT) mode for atomic force microscopy (AFM). This new method significantly speeds up imaging of dynamic materials without losing data quality.

Keywords:
atomic force microscopyhigh-speed imagingnanomechanical characterizationoff-resonance tappingviscoelastic material

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Biomaterials Science

Background:

  • Atomic force microscopy (AFM) enables simultaneous mechanical mapping and topographical characterization.
  • Off-resonance tapping (ORT) mode in AFM provides dual functionality but suffers from low imaging speeds due to closed-loop delay and limited robustness.
  • Studying dynamic specimens is challenging with current ORT mode limitations.

Purpose of the Study:

  • To enhance the imaging speed of ORT mode in AFM.
  • To overcome the limitations of conventional ORT mode, specifically closed-loop delay and robustness.
  • To enable high-speed characterization of dynamic materials and biomaterials.

Main Methods:

  • Developed an integral off-resonance tapping (I-ORT) mode for AFM.
  • Replaced fixed-point sampling with integral sampling of the interaction curve above the baseline.
  • Maintained the same drive and sensing conditions as conventional ORT mode.

Main Results:

  • Achieved a 10-fold increase in scanning speed compared to conventional ORT mode.
  • Maintained the quality of mechanical property characterization.
  • Mitigated unpredictable interference from probe-sample interactions.

Conclusions:

  • The I-ORT mode significantly enhances the speed of AFM imaging.
  • This advancement overcomes previous limitations, enabling the study of dynamic specimens.
  • I-ORT mode supports high-end nanotechnological research by providing faster, high-resolution characterization.