Feature enhancement and fusion-optimized defect detection model for Sanhua plums

Yu Chen1, Yuanxia Zhang1

  • 1Yulin Normal University, Yulin, China.

Frontiers in Plant Science
|February 16, 2026
PubMed
Summary

This study developed YOLO-CMA, an advanced fruit defect detection model, to precisely identify minor issues like insect damage in Sanhua plums. The model offers high accuracy with minimal computational cost, ideal for agricultural applications.