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Updated: May 3, 2026

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
Published on: April 13, 2016
Xun Zuo1, Ning Zhao1, Ke Wang2
1School of Information Engineering, Wuhan University of Technology, Wuhan 430070, China.
This study introduces MDEB-YOLO, a novel deep learning model for detecting micro-defects on Printed Circuit Boards (PCBs). It achieves high accuracy and speed, outperforming existing methods for crucial industrial quality control.
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