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Machine-Learning-Assisted Buried-Window FET Sensors for High-Reliability and High-Sensitivity Applications
Mahsa Mehrad1, Meysam Zareiee2
1Department of Technology, School of Electrical and Mechanical Engineering, University of Portsmouth, Portsmouth SR6 0DD, UK.
Sensors (Basel, Switzerland)
|February 27, 2026
Summary
A new Double Buried-Window Junctionless Field-Effect Transistor (DBW-FET) enhances biosensing. This novel transistor design improves sensitivity and performance for next-generation nanoscale biosensors.
Area of Science:
- Nanotechnology
- Electronics Engineering
- Biomedical Engineering
Background:
- Label-free biosensing is crucial for early disease detection.
- Existing biosensors face challenges in sensitivity and scalability.
- Junctionless Field-Effect Transistors (JLFETs) show potential for biosensing.
Purpose of the Study:
- To introduce a novel Double Buried-Window Junctionless Field-Effect Transistor (DBW-FET).
- To enhance sensitivity and performance for label-free biosensing applications.
- To optimize the DBW-FET design using machine learning.
Main Methods:
- Device fabrication and characterization (simulated).
- Numerical simulations using Silvaco TCAD Atlas.
- Machine learning-assisted optimization (Gaussian Process Regression and Bayesian Optimization).
Main Results:
- DBW-FET demonstrated higher drain current and lower subthreshold swing than conventional JLFETs.
- Dual buried windows improved electrostatic coupling and biomolecular sensitivity.
- Optimized DBW-FET achieved a 20-25% improvement in current sensitivity.
Conclusions:
- The DBW-FET presents a promising architecture for high-sensitivity biosensing.
- The device is compatible with Complementary Metal-Oxide-Semiconductor (CMOS) technology.
- DBW-FETs offer a pathway for next-generation nanoscale biosensors.
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