Related Experiment Video
Updated: Jun 9, 2026

11:14
Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Correction to "Landauer Resistivity Dipole at One-Dimensional Defect Revealed via near-Field Photocurrent Nanoscopy"
Nano Letters
|March 4, 2026
Abstract
No abstract available in PubMed .
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