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Defect detection method of printed circuit boards based on EDF-YOLOv10
Zhijuan Shen1, Yonger Yao1, Lin Liu1
1School of Mechanical, Electronic & Information Engineering, Putian University, Putian, Fujian, China.
This study introduces an enhanced YOLOv10 algorithm (EDF-YOLOv10) for printed circuit board (PCB) defect detection, improving small object recognition and convergence speed. A real-time detection system was also developed, achieving significant performance gains.
Area of Science:
- Computer Vision
- Artificial Intelligence
- Electrical Engineering
Background:
- Printed circuit board (PCB) defect detection faces challenges with small object representation and slow model convergence.
- Existing methods struggle with complex industrial environments and robust feature extraction.
Purpose of the Study:
- To propose an improved YOLOv10 algorithm (EDF-YOLOv10) for enhanced PCB defect detection.
- To develop a real-time, co-optimized hardware and software detection system.
- To improve feature representation for small defects and accelerate model convergence.
Main Methods:
- Incorporated Efficient Channel Attention (ECA) for key channel feature extraction.
- Utilized Dynamic Snake Convolution (DSConv) for improved geometric structure recognition of small targets.
- Implemented Focaler-CIoU loss to enhance hard sample learning and convergence.
- Applied extensive data augmentation to the PKU-Market-PCB dataset for robustness.
- Developed a real-time detection system with industrial cameras, controllable lighting, and a PyQt5 GUI.
Main Results:
- The EDF-YOLOv10 model achieved mAP@0.50 of 90.6% and mAP@0.50:0.95 of 48.4%.
- Demonstrated improvements of 3.0% and 1.6% over the baseline model, respectively.
- The real-time detection system successfully integrated hardware and software for practical application.
Conclusions:
- The proposed EDF-YOLOv10 algorithm effectively addresses limitations in PCB defect detection, particularly for small objects.
- The developed real-time system offers a robust solution for industrial applications.
- This work provides a valuable methodological reference for complex industrial defect detection scenarios.
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