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Updated: Mar 12, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Quantitative Regulation of CuZn Antisite Defects in Cu2ZnSnS4 via Cd2+ Substitution
Qiang Zhu1, Hanyu Tong1, Hai Ma1
1Key Laboratory of Polar Materials and Devices (MOE), Department of Electronics, East China Normal University, Shanghai 200241, P. R. China.
Abstract:
Cation disorder-induced defects, particularly CuZn antisite defects, are widely recognized as a major origin of band tailing and open-circuit voltage deficit in Cu2ZnSnS4 (CZTS) solar cells. Herein, we systematically investigate the effects of Cd2+ substitution at Zn2+ sites on the microstructure, defect properties, and photovoltaic performance of CZTS absorbers. Moderate Cd incorporation induces lattice expansion without secondary-phase formation and promotes grain growth, resulting in a compact columnar microstructure. Bandgap narrowing and enhanced long-wavelength photoresponse led to a pronounced increase in short-circuit current density. Defect-sensitive analyses reveal that Cd substitution effectively mitigates energetic disorder. The Urbach energy extracted from external quantum efficiency spectra decreases from 29.2 to 24.4 meV, indicating suppressed band tailing. Capacitance-voltage and drive-level capacitance profiling measurements further demonstrate a substantial reduction in bulk and interface defect densities, accompanied by an expanded depletion width. Temperature-dependent admittance spectroscopy identifies CuZn antisite defects as the dominant electrically active states and quantitatively confirms that Cd substitution reduces their concentration from 1.16 × 1016 to 4.21 × 1015 cm-3. Consequently, Fermi-level pinning is alleviated, carrier transport is enhanced, and a maximum efficiency of 8.53% is achieved for the Cd-3 device. This work provides quantitative insight into defect regulation in kesterite absorbers and highlights Cd incorporation as an effective defect engineering strategy.
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