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Updated: Mar 13, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Layer-Number-Dependent Metal-Insulator Transition in Topological Semimetal Nb3SiTe6
Rencong Zhang1,2, Ruihan Zhang1,2, Jingyu Yao1,2
1Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China.
Abstract:
Topologically nontrivial materials are distinguished by their inherent robustness against symmetry-preserving perturbations. However, the resilience of the topologically protected degeneracies against electronic instabilities remains largely unexplored. Here, by employing transport measurements, we demonstrate a layer-number-dependent metal-insulator transition in the topological semimetal Nb3SiTe6, which has a layered structure and exhibits Fermi-liquid-like metallicity with a hole carrier density of ∼3.3 × 1021 cm-3 down to the bilayers. An unexpected insulating ground state only emerges in the monolayer and can be effectively tuned by electrostatic gating. The charge neutrality point coincides with a sign change of the Hall signal. Such ambipolar gating behavior contradicts the degeneracy protection under the glide-mirror symmetry in the single-particle picture. Combined with theoretical calculations, we suggest that electronic instabilities could offer a plausible mechanism for gap opening at the symmetry-protected nodal lines. Our findings provide crucial insights for understanding the rich dimension-related metal-insulator transitions in topological materials.
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