Semiconductors
Types of Semiconductors
Metal-Semiconductor Junctions
Fermi Level Dynamics
Scanning Electron Microscopy
Biasing of Metal-Semiconductor Junctions
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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
1College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing 210023, China.
Advancements in information technology face limitations with current materials. Novel 3D nanostructures offer a path beyond these constraints for faster, more efficient electronics.
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