Metal-Semiconductor Junctions
Electrostatic Boundary Conditions
Biasing of P-N Junction
Biasing of Metal-Semiconductor Junctions
Biasing of FET
Induced Electric Dipoles
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A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics
Published on: August 28, 2018
This study introduces a dual-function sensor using topological corner states (TCSs) for simultaneous refractive index and temperature detection. This innovation advances multifunctional sensing for compact nanophotonic devices.
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