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Published on: May 13, 2020
1T-TCAM with binary storage enabling ternary matching via bias-controlled wildcards using a feedback field-effect
Sujin Kim1, Junyoung Park2, Doohyeok Lim3
1Department of Intelligent Robot Engineering, Pukyong National University, 45, Yongso-ro, Busan, Nam-gu 48513, Republic of Korea.
This study introduces a novel one-transistor ternary content-addressable memory (1T-TCAM) cell. It achieves ternary matching with binary storage, offering fast search speeds and high integration density for advanced memory applications.
Area of Science:
- Semiconductor device physics
- Memory technology
- Computer architecture
Background:
- Ternary content-addressable memory (TCAM) is crucial for high-speed search applications.
- Existing TCAM cells often face challenges in power consumption and integration density.
- A reconfigurable cell enabling ternary matching with binary storage is desirable.
Purpose of the Study:
- To propose and analyze a novel reconfigurable one-transistor ternary content-addressable memory (1T-TCAM) cell.
- To demonstrate ternary matching capabilities using binary data storage.
- To evaluate the performance of the proposed cell using TCAD simulations.
Main Methods:
- Device fabrication using a triple-gated feedback field-effect transistor (FBFET) with a nitride charge-trapping layer.
- Analysis of energy band diagrams and electrical characteristics.
- TCAD simulation of cell-level functionality, sensing margin, search time, and 8-bit array performance.
Main Results:
- The proposed 1T-TCAM cell supports 'Search 0', 'Search 1', and 'Don't Care' operations via gate voltage control.
- Achieved a search time below 2 ns with a high on-current of approximately 10 µA.
- Demonstrated a sensing margin exceeding 10^10, indicating robust performance.
Conclusions:
- The novel 1T-TCAM cell offers efficient ternary matching with binary storage.
- It exhibits high CMOS process compatibility, superior integration density, and high-speed search capabilities.
- The design presents a promising solution for next-generation memory systems.
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