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Updated: Mar 21, 2026

Using Microwave and Macroscopic Samples of Dielectric Solids to Study the Photonic Properties of Disordered Photonic Bandgap Materials
Published on: September 26, 2014
Qi Wang1, Qiang Zhu2, Huan Fei Wen3
1State Key Laboratory of Extreme Environment Optoelectronic Dynamic Measurement Technology and Instrument, North University of China, Taiyuan, Shanxi, China.
This study introduces a dual-port inverted scanning imaging method for broadband microwave imaging. The technique uses a silicon tip to scan samples, revealing distinct electromagnetic responses for applications in materials science and biomedicine.
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