Related Experiment Video
Updated: Mar 27, 2026

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
Published on: July 17, 2015
Partial coherence of inelastically scattered electrons in transmission electron microscopy
1Dept. of Physics, Durham University, South Road, Durham, DH1 3LE, UK.
None:
Coherence of electron waves is central to transmission electron microscopy. However, the mechanism underlying partial loss of coherence during inelastic scattering has been a perplexing problem for many decades. Here we show that the inelastic collision time is the key parameter governing coherence. Large energy transfers have short collision times and an inversely decaying coherence length. It is also shown that the inelastic coherence volume is highly elongated along the electron beam direction. Plasmon excitation and inter-band transition events therefore have only a minor effect on dynamical diffraction, a fact confirmed by energy filtered measurements on [001]-oriented SrTiO3.
More Related Videos
11:14Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
08:31Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments
Published on: June 27, 2022
Related Concept Videos
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
Electron Microscope Tomography and Single-particle Reconstruction
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Overview of Electron Microscopy
Transmission Electron Microscopy
The de Broglie Wavelength
Preparation of Samples for Electron Microscopy