A Physics-Consistent Framework for Semiconductor Device Reliability Including Multiple Degradation Mechanisms.

Area of Science:

• Materials Science
• Electrical Engineering
• Reliability Engineering

Background:

• Semiconductor device reliability assessment is complex due to multiple simultaneous degradation mechanisms.
• Conventional methods often use oversimplified assumptions, leading to uncertainty in lifetime predictions.
• Modern standards, like JEDEC, require more robust approaches for reliability testing.

Purpose of the Study:

• To present a general analytical framework for semiconductor device reliability.
• To explicitly accommodate multiple competing degradation mechanisms in reliability assessment.
• To improve the accuracy and robustness of lifetime prediction for semiconductor devices.

Main Methods:

• Developed a framework separating physical degradation processes from data interpretation models.
• Analyzed degradation behaviors with sublinear time dependence.
• Introduced a reformulated analytical representation for lifetime extraction.

Main Results:

• The framework allows combining independent mechanisms without imposing a physical model.
• Common data interpretation practices can introduce systematic errors with sublinear kinetics.
• The reformulated representation enhances clarity and robustness in lifetime extraction.

Conclusions:

• The proposed framework provides consistent reliability assessment and credible lifetime prediction.
• It is compatible with established reliability theory and modern JEDEC standards.
• The approach supports more accurate analysis across various materials, devices, and operating conditions.