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Updated: Apr 2, 2026

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Published on: April 18, 2019
Free-carrier lifetime measurement in integrated Q-InP channel waveguides for quantum applications
Abstract:
Free-carrier lifetime (τFCL) is a critical parameter that describes the nonlinear dynamics of various materials. It determines the responsiveness of free carriers and, eventually, influences the nonlinear losses due to two-photon absorption (TPA) and free-carrier absorption (FCA) effects. Here, we experimentally measure the value of τFCL of an integrated quaternary InP (Q-InP) passive channel waveguide based on a commercial foundry (SMART Photonics). We employ the pump-probe spectroscopy technique and measure the τFCL of 2.32(±0.12) ns for a low-footprint channel waveguide of 0.564 mm length. Waveguides based on InP channels are potential candidates for single-photon generation through spontaneous four-wave mixing (SFWM) due to their high nonlinearity. Given their high TPA coefficient at 1550 nm, measuring τFCL is highly relevant for determining acceptable input power levels to avoid nonlinear losses.
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