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Development of electron source feedback for enhanced X-ray beam stability at NSLS-II.

Sukho Kongtawong1, Yoshiteru Hidaka1, Hanfei Yan1

  • 1National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, USA.

Journal of Synchrotron Radiation
|April 2, 2026
PubMed
Summary

Future X-ray microscopy needs stable beams. This study uses the electron beam for feedback, successfully reducing vibrations and improving imaging quality for next-generation synchrotron light sources.

Keywords:
NSLS-IIX-ray beam stabilityX-ray nanoprobesource feedback

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Area of Science:

  • Synchrotron radiation science
  • X-ray microscopy
  • Accelerator physics

Background:

  • Next-generation synchrotron light sources demand enhanced X-ray beam stability for advanced imaging.
  • Existing mechanical feedback systems offer limited suppression of dominant vibrations (27 Hz, 120 Hz) at the Hard X-ray Nanoprobe (HXN) beamline.
  • Vibrations degrade measurement accuracy and X-ray image quality.

Purpose of the Study:

  • To investigate the electron beam as an active actuator for vibration feedback control.
  • To enhance X-ray beam stability at the focusing point.
  • To assess the effectiveness of electron-beam-based feedback for fast-scanning microscopy.

Main Methods:

  • Integration of X-ray beam position monitor signals into the fast orbit feedback system.
  • Utilizing a dedicated electrometer for signal processing.
  • Implementing electron beam as the feedback actuator.

Main Results:

  • Effective suppression of dominant vibration peaks at 27 Hz and 120 Hz.
  • Demonstrated enhancement of X-ray beam stability at the focusing point.
  • Ptychography measurements showed reduced background fluctuations and mitigated vibration artifacts during fast scanning.

Conclusions:

  • Electron-beam-based feedback is a feasible approach for stabilizing X-ray beams in next-generation synchrotrons.
  • This method significantly improves stability and reduces artifacts in fast-scanning imaging.
  • Provides an experimental foundation for implementing this technique in future light source applications.