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Updated: Apr 11, 2026

High-resolution Episcopic Microscopy HREM - Simple and Robust Protocols for Processing and Visualizing Organic Materials
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High-resolution Episcopic Microscopy HREM - Simple and Robust Protocols for Processing and Visualizing Organic Materials

Published on: July 7, 2017

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Damage-limited resolution for X-ray and electron microscopy of organic specimens

Ray F Egerton1, Colin Nave2

  • 1Physics Department, University of Alberta, Edmonton, AB T6G 2E1, Canada.

Acta Crystallographica. Section D, Structural Biology
|April 10, 2026
PubMed

Keywords:
X-ray microscopydose-limited resolutionelectron microscopyradiation damageradiolysis

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