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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: Apr 15, 2026

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

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Atomic force microscopy (AFM) tip metrology and inspection by knife edge diffractometry.

Kuan Lu¹, Pengfei Lin¹, Hyeonho Cho²

¹J. Mike Walker '66 Department of Mechanical Engineering, Texas A&M University, 3123 TAMU, College Station, Texas 77843-3123, USA.

The Review of Scientific Instruments

|April 14, 2026

Summary

This study introduces a new, non-destructive method to monitor Atomic Force Microscopy (AFM) tip wear using interferometry and diffraction theory. The technique efficiently quantifies tip wear by analyzing fringe patterns, aiding in maintaining instrument performance.

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Area of Science:

Physics
Materials Science
Nanotechnology

Background:

Atomic Force Microscopy (AFM) is crucial for nanoscale imaging.
AFM tip wear affects image quality and measurement accuracy.
Characterizing tip wear is essential for reliable AFM operation.

Purpose of the Study:

To develop a novel, non-destructive method for Atomic Force Microscopy (AFM) tip characterization.
To enable efficient monitoring of AFM tip wear and degradation.
To correlate interferometric fringe features with tip radius and roughness changes.

Main Methods:

Integration of knife-edge interferometry with Rayleigh-Sommerfeld diffraction theory.
Controlled tip wear generation using a two-stage etching process.
Analysis of fringe pattern characteristics (spacing, entropy) and quantitative metrics (SSIM, SI, MSE).

Main Results:

Fringe patterns systematically changed with increasing tip wear.
Tip sharpness decrease correlated with specific fringe characteristic alterations.
Quantitative analysis provided reliable indicators of tip geometry and roughness.

Conclusions:

The proposed method offers a non-destructive and efficient approach for monitoring AFM tip wear.
Relating fringe features to simulated patterns allows for rapid quantitative wear evaluation.
Validated results confirm the method's efficacy for tip characterization.