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Pengfei Lin

1PUBLICATIONS

4CO-AUTHORS

Nonlinear optics and spectroscopy

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Publications (1)

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|Apr 14, 2026

Atomic force microscopy (AFM) tip metrology and inspection by knife edge diffractometry.

Kuan Lu, Pengfei Lin, Hyeonho Cho

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Kuan Lu

1 joint publications

Hyeonho Cho

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Sunghan Kim

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ChaBum Lee

Frequent Collaborators

1 joint publications

Kuan Lu

1 joint publications

Hyeonho Cho

1 joint publications

Sunghan Kim

1 joint publications

ChaBum Lee

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