Chabum Lee
2PUBLICATIONS
7CO-AUTHORS
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Publications (2)
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|Apr 14, 2026
Atomic force microscopy (AFM) tip metrology and inspection by knife edge diffractometry.Kuan Lu, Pengfei Lin, Hyeonho Cho
|Jul 14, 2023
A differentially amplified Hall effect displacement sensor for positioning control of a long-range flexure stage.William Park, Heebum Chun, Phuc Nguyen
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