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Updated: Apr 16, 2026

Use of Sacrificial Nanoparticles to Remove the Effects of Shot-noise in Contact Holes Fabricated by E-beam Lithography
Published on: February 12, 2017
Madan Rajendra Biradar1, Gokhan Sagdic1, Chenyun Yuan1
1Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, United States.
This review traces the evolution of photoresist materials for microelectronics, focusing on challenges and solutions in extreme ultraviolet (EUV) lithography. It highlights advanced resist designs and computational approaches for future patterning strategies.
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