Imperfections in Crystal Structure: Point, Line and Plane Defects
Imperfections in Crystal Structure: Stoichiometric Point Defects
Imperfections in Crystal Structure: Non-Stoichiometric Defects
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Updated: May 4, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Md Habibur Rahman1, Maitreyo Biswas1, Arun Mannodi-Kanakkithodi1
1School of Materials Engineering, Purdue University, West Lafayette, IN 47907, USA. amannodi@purdue.edu.
We created DeFecT-FF, a framework using machine learning force fields and DFT to predict defect properties in CdTe solar cells. This tool accelerates the discovery of new low-energy defect configurations for improved solar cell performance.
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