Biasing of FET
Field Effect Transistor
Semiconductors
Biasing of Metal-Semiconductor Junctions
MOSFET
Metal-Semiconductor Junctions
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Updated: Apr 22, 2026

A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy
Published on: April 8, 2018
Hyunho Seok1,2,3, Geonwook Kim4, Sihoon Son2,3
1Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA.
Researchers developed a monolithic 3D integration platform using Indium Gallium Zinc Oxide (IGZO) and Hafnium Zirconium Oxide (HZO) ferroelectric field-effect transistors (FeFETs). This novel hardware accelerates artificial intelligence (AI) by enabling efficient compute-in-memory and neuromorphic computing.
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