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Beam teleportation for precision dose control in scanning transmission electron microscopy

Jonathan D Hollenbach1, Stewart A Koppell1, Darian Smalley1

  • 1Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, 21218, MD, USA.

Ultramicroscopy
|April 23, 2026
PubMed
Summary

Researchers developed a beam blanking technique for scanning transmission electron microscopy (STEM) to eliminate dose artifacts from beam inertia. This method improves image quality and enables precise structural manipulation in STEM imaging.

Keywords:
Beam teleportationDose controlElectrostatic blankingLow dose imagingScanning transmission electron microscopy

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