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Updated: Apr 29, 2026

15:47
Nanofabrication of Gate-defined GaAs/AlGaAs Lateral Quantum Dots
Published on: November 1, 2013
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Reliability assessment of Z-shaped gate TFET under interface trap charges and thermal variations for low-power
Tammisetti Ashok1, Chandan Kumar Pandey2
1Department of ECE, Dr. RVR NRI Institute of Technology (Deemed to be University), Pothavarappadu (V), Agiripalli (M), Vijayawada Rural, Andhra Pradesh, 521212, India.
Scientific Reports
|April 27, 2026
Abstract
No abstract available in PubMed .
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