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EPI-guided adaptive refocusing for high-SNR 3D measurement in a large-DOF MEMS-based structured light field
Optics Express
|May 4, 2026
Summary
This study introduces an EPI-guided adaptive refocusing model (EGARM) to improve 3D measurement accuracy using structured light field (SLF) technology. The novel method effectively suppresses speckle noise, enhancing 3D reconstruction quality over a large depth of field.
Area of Science:
- Optics and Photonics
- Metrology
- Computer Vision
Background:
- Structured light field (SLF) 3D measurement combines micro-electro-mechanical system (MEMS) projection with unfocused plenoptic cameras (UPC) for large depth of field (DOF) metrology.
- High laser coherence and small UPC sub-apertures cause speckle and low signal-to-noise ratio (SNR), degrading reconstruction accuracy.
Purpose of the Study:
- To propose and validate an EPI-guided adaptive refocusing model (EGARM) for enhancing 3D measurement accuracy in SLF systems.
- To address speckle noise and low SNR issues inherent in current SLF metrology techniques.
- To achieve stable and accurate 3D reconstruction over an extended depth range and field of view.
Main Methods:
- Employs phase-encoded epipolar plane image (EPI) analysis to extract phase features and estimate a depth-related slope factor.
- Utilizes the estimated slope factor to guide digital refocusing, aggregating multiple sub-aperture views from the 4D light field for speckle suppression.
- Introduces a refocused ray calibration and global geometric refinement framework to impose global geometric constraints.
Main Results:
- Demonstrates stable 3D reconstruction over an extended depth range of approximately 400-1856 mm.
- Achieves a significant expansion of the effective field of view (FOV) from 120 mm × 200 mm to 580 mm × 780 mm.
- Maintains a reconstruction accuracy consistently better than 0.45 mm across the measurement volume.
Conclusions:
- The proposed EGARM effectively suppresses speckle and improves SNR, leading to enhanced 3D reconstruction accuracy in SLF systems.
- The method enables stable and accurate 3D measurements over a large depth range and expanded FOV.
- EGARM represents a significant advancement in large-DOF metrology, overcoming limitations of previous techniques.

