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Three-Dimensional Shape Measurement Using Speckle-Assisted Phase-Order Lines Without Phase Unwrapping.

Ziyou Zhang1, Weipeng Yang1

  • 1School of Artificial Intelligence, Chengdu Technological University, Chengdu 611730, China.

Sensors (Basel, Switzerland)
|May 4, 2026
PubMed
Summary

This study introduces a new 3D shape measurement method using phase-order lines (POLs) to avoid phase unwrapping. This technique achieves high accuracy and speed with fewer patterns, enabling faster and simpler 3D measurements.

Keywords:
3D shape measurementfringe projectionphase-order linespeckle projectionstereo matchingstructured light

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Area of Science:

  • Optics and Photonics
  • Computer Vision
  • Metrology

Background:

  • High-accuracy and high-speed 3D shape measurement is crucial but challenging.
  • Traditional methods often require complex phase unwrapping, increasing processing time and error.
  • Existing techniques struggle to balance accuracy, speed, and the number of required patterns.

Purpose of the Study:

  • To present a novel 3D shape measurement technique that eliminates the need for phase unwrapping.
  • To improve the efficiency and reduce the complexity of binocular stereo vision systems for 3D measurement.
  • To achieve high-accuracy 3D measurements with a significantly reduced number of phase patterns.

Main Methods:

  • Developed a novel technique utilizing phase-order lines (POLs) extracted directly from wrapped phase data.
  • Combined phase-shifting for high resolution with speckle projection for robust feature extraction and stereo correspondence.
  • Employed matched POLs as seeds to guide dense, sub-pixel matching on wrapped phase, bypassing traditional phase unwrapping.

Main Results:

  • Achieved a root-mean-square (RMS) error of 0.058 mm with only five phase patterns.
  • Demonstrated accuracy comparable to a 12-pattern temporal phase unwrapping (TPU) method.
  • Significantly reduced measurement time due to the elimination of the phase unwrapping step.

Conclusions:

  • The proposed POL-based method offers a faster and simpler approach to high-accuracy 3D shape measurement.
  • This technique effectively bypasses the complex phase unwrapping process, improving overall efficiency.
  • The method provides a practical solution for applications requiring rapid and precise 3D reconstruction.