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Updated: May 5, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Atomistic tight-binding Hartree-Fock calculations of multielectron configurations in P-doped silicon devices:
Maicol A Ochoa1,2, Keyi Liu1,3, Piotr Różański4
1National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
We used atomistic calculations to study electron states in phosphorus atoms and dimers in silicon for quantum computing. Our method accurately predicts electron interactions and states, guiding the development of silicon quantum devices.
Area of Science:
- Quantum Computing
- Condensed Matter Physics
- Computational Materials Science
Background:
- Donor-based quantum devices in silicon offer potential for quantum computing and simulations.
- Precise dopant placement is key to controlling quantum properties in these devices.
Purpose of the Study:
- To perform atomistic calculations of many-electron states in single phosphorus atoms and dimers in silicon.
- To analyze electron energies, charging, and binding energies as a function of impurity separation.
Main Methods:
- Utilized self-consistent tight-binding Hamiltonians and Hartree-Fock equations for atomistic calculations.
- Computed Coulomb and exchange integrals without reliance on atomic orbital sets.
- Validated the tight-binding Hartree-Fock protocol against configuration-interaction calculations.
Main Results:
- The formalism accurately estimates electron-electron repulsion energy for single phosphorus atoms.
- Calculations predict an antiferromagnetic ground state for a two-electron system in phosphorus dimers.
- A weakly bound three-electron state was observed in phosphorus dimers within considered separations.
Conclusions:
- The atomistic, self-consistent method provides accurate insights into electron states in silicon-based quantum devices.
- Results offer a pathway to understanding and optimizing donor-based quantum systems for computing and simulation.
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