DRIFT-EM enables direct wafer retrieval of ultrathin serial sections for large-volume electron microscopy

Large-volume serial electron microscopy (vEM) has transformed neuroscience by enabling reconstructions of neural circuits at synaptic resolution. Approaches to collecting libraries of ultrathin sections required for producing vEM datasets have been devised (e.g., automated tape-collecting ultramicrotome [ATUM], MagC, and GAUSS-EM), which has advanced the scalability of vEM in distinct ways, yet widespread adoption remains constrained by cost, hardware requirements, or infrastructure demands. Here, we introduce direct retrieval by ionizer-facilitated transfer for electron microscopy (DRIFT-EM), a low-cost and easily implemented platform designed to broaden access to direct wafer-based collection of ultrathin sections. Off-the-shelf static ionizers clear newly cut sections from the knife edge, a thermoplastic boundary confines sections, and an open-source software pipeline automates region of interest identification to guide imaging. DRIFT-EM achieves section packing densities comparable to established magnetic methods, with minimal setup cost and maintenance. Its modular style, 3D-printed components, and open design facilitate integration with other vEM workflows, helping lower barriers to creating connectomes.