Electronic Distance Measuring Instruments
Distance Corrections
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Updated: May 14, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Jiawang Fang1,2,3, Chenlong Ou1,2,3, Fengwei Liu1,2
1State Key Laboratory of Optical Field Manipulation Science and Technology, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China.
This study introduces a novel absolute distance measurement system using three-wavelength interferometry for high-precision ranging. The system achieves a 240 μm unambiguous range with nanometer-level accuracy, ideal for industrial applications.
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