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Related Concept Videos

Electronic Distance Measuring Instruments01:30

Electronic Distance Measuring Instruments

Electronic Distance Measuring Instruments (EDMs) are essential tools in modern surveying, offering precise distance measurements by emitting electromagnetic signals and calculating the time required for these signals to travel to a target and return. Two primary types of signals are used in EDMs — light waves and microwaves — each suited to specific environmental and distance requirements. Light-wave-based EDMs utilize either infrared or laser light, providing high accuracy over short distances...
Distance Corrections01:15

Distance Corrections

To achieve precise distance measurements, especially in surveying and construction, certain corrections must be applied to account for potential sources of error like the standardization errors, temperature variations, and slope adjustments.Standardization error emerges when measurement equipment undergoes changes, such as wear, repairs, or weather impacts. To address this, surveyors compare the equipment’s readings to a standard. This process identifies any deviation that might lead to...

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Updated: May 14, 2026

Implementation of a Reference Interferometer for Nanodetection
16:11

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Published on: April 26, 2014

Multi-Wavelength Interferometric Absolute Distance Measurement and Dynamic Demodulation Error Compensation.

Jiawang Fang1,2,3, Chenlong Ou1,2,3, Fengwei Liu1,2

  • 1State Key Laboratory of Optical Field Manipulation Science and Technology, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China.

Sensors (Basel, Switzerland)
|May 13, 2026
PubMed
Summary
This summary is machine-generated.

This study introduces a novel absolute distance measurement system using three-wavelength interferometry for high-precision ranging. The system achieves a 240 μm unambiguous range with nanometer-level accuracy, ideal for industrial applications.

Keywords:
absolute distance measurementmulti-wavelength interferencesine phase modulationthe decimal multiple method

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Area of Science:

  • Optical Metrology
  • Precision Measurement Systems

Background:

  • Traditional interferometry faces limitations in absolute distance measurement range.
  • Phase-shifting interferometry (PSI) is a key technique for high-accuracy distance determination.

Purpose of the Study:

  • To develop a high-precision absolute distance measurement system with an extended unambiguous range.
  • To address limitations of conventional interferometric methods for absolute ranging.

Main Methods:

  • Implementation of a three-wavelength synchronous phase-shifting interferometry system.
  • Establishment of a synthetic wavelength chain using three semiconductor lasers in an all-fiber Fizeau interferometer.
  • Integration of piezoelectric transducer (PZT)-driven phase modulation, multi-channel synchronous sampling, and fractional multiplication for phase demodulation.

Main Results:

  • Achieved an unambiguous measurement range of 240 μm.
  • Demonstrated static measurement precision better than 0.6 nm.
  • Obtained dynamic displacement measurement accuracy superior to 2 nm compared to a reference device.

Conclusions:

  • The proposed system offers a robust and high-precision solution for absolute distance measurement.
  • The method shows significant potential for industrial precision inspection and optical sensing applications.
  • Systematic analysis and compensation of error sources, including PZT nonlinearity, enhance measurement reliability.