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Updated: May 20, 2026

High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques
Published on: December 3, 2013
Super-resolution image projection over an extended depth of field using a diffractive decoder
Hanlong Chen1,2,3, Çağatay Işıl1,2,3, Che-Yung Shen1,2,3
1Electrical and Computer Engineering Department, University of California, Los Angeles, CA, USA.
Abstract:
Image projection systems must be efficient in data storage, computation and transmission while maintaining a large space-bandwidth-product (SBP) at their output. Here, we introduce a hybrid image projection system that achieves extended depth-of-field (DOF) with improved resolution, combining a convolutional neural network (CNN)-based digital encoder with an all-optical diffractive decoder. A CNN-based encoder compresses input images into compact phase representations, which are subsequently displayed by a low-resolution (LR) projector and processed by an analog diffractive decoder for all-optical image reconstruction. This optical decoder is completely passive, designed to synthesize pixel super-resolved image projections that feature an extended DOF while eliminating the need for additional power consumption for super-resolved image reconstruction. Our pixel super-resolution (PSR) image projection system demonstrates high-fidelity image synthesis over an extended DOF of ≥250λ, where λ is the illumination wavelength, concurrently offering up to ~16-fold SBP improvement at each lateral plane. The feasibility of this approach is validated through proof-of-concept experiments conducted in both the terahertz and visible spectral regions, demonstrating the scalability of our hybrid system across different wavelengths. This image projection architecture can reduce data storage and transmission requirements for display systems without imposing additional power constraints on the optical decoder. Beyond extended DOF PSR image projection, the underlying principles of this approach can be extended to various applications, including optical metrology and microscopy.
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