Frequency of electrode migration and other device-related complications in a large single-center cochlear implant

Julia van de Loo1, Ruth Lang-Roth2, Verena Müller2

  • 1Medical Faculty, Department of Otorhinolaryngology, Head and Neck Surgery, University of Cologne, 50924, Cologne, Germany. Julia.van-de-loo@uk-koeln.de.

Abstract

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