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DAER-YOLO: Defect-Aware and Edge-Reconstruction Enhanced YOLO for Surface Defect Detection of Varistors

Wu Xie1,2, Shushuo Yao1,2, Tao Zhang3

  • 1School of Computer Science and Information Security, Guilin University of Electronic Technology, Guilin 541004, China.

Journal of Imaging
|May 26, 2026
PubMed

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