Overview of Microscopy Techniques
Scanning Electron Microscopy
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Updated: Jun 2, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Emma York1,2, Latha Venkataraman1,2,3
1Department of Chemistry, Columbia University, New York, New York 10027, United States.
This tutorial guides researchers on using the scanning tunneling microscope-based break-junction (STM-BJ) technique for molecular electronics. It covers instrumentation, data analysis, and troubleshooting for precise electronic transport measurements.
09:26In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
Published on: June 26, 2015
09:06Visualizing Uniaxial-strain Manipulation of Antiferromagnetic Domains in Fe1+YTe Using a Spin-polarized Scanning Tunneling Microscope
Published on: March 24, 2019
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