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Galvanometer-scanning transient phase microscopy with balanced detection and arbitrary pump polarization.

Cameron N Coleal1, Randy A Bartels2, Jesse W Wilson3,4

  • 1Los Alamos National Laboratories.

Journal of the Optical Society of America. B, Optical Physics
|June 4, 2026
PubMed
Summary
This summary is machine-generated.

Transient phase microscopy was advanced for galvanometer-scanning microscopes, enabling simultaneous amplitude and phase measurements. This technique offers advantages for various samples, including biological tissues and graphene.

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Area of Science:

  • Optics and Photonics
  • Materials Science
  • Biomedical Optics

Background:

  • Transient absorption microscopy (TAM) probes excited-state kinetics via the imaginary part of refractive index changes.
  • Transient phase microscopy (TPM) complements TAM by measuring the real part of refractive index changes.
  • Current TPM lacks galvanometer scanning, limiting its application to non-imaging spectroscopy.

Purpose of the Study:

  • To integrate transient phase microscopy with galvanometer scanning for imaging applications.
  • To compare amplitude and phase measurements in various materials and biological samples.
  • To investigate the impact of galvanometer scanning on TPM performance.

Main Methods:

  • Development of a galvanometer-scanning transient phase microscope with balanced detection.
  • Comparison of amplitude and phase measurements in graphene, hemoglobin, and red blood cells.
  • Analysis of galvanometer scanning effects and pump polarization control.

Main Results:

  • Successful implementation of TPM in a galvanometer-scanning microscope.
  • Demonstrated advantages of phase detection for hemoglobin and red blood cells.
  • Identified benefits of amplitude detection for graphene.
  • Characterized limitations and impacts of galvanometer scanning.

Conclusions:

  • Galvanometer-scanning TPM expands imaging capabilities for materials and biomedical sciences.
  • The choice between amplitude and phase detection depends on sample properties and probe wavelength.
  • This advancement broadens the applicability of transient phase microscopy.