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Updated: Jun 5, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
High resolution incoherent Thomson scattering diagnostic for the Resonant Antenna Ion Device (RAID) helicon plasmas
C Stollberg1, R Karimov1, Ph Guittienne1
1Ecole Polytechnique Fédérale de Lausanne (EPFL), Swiss Plasma Center (SPC), CH-1015 Lausanne, Switzerland.
Abstract:
We present a recent upgrade of the incoherent Thomson scattering (TS) diagnostic for the Resonant Antenna Ion Device (RAID), a linear plasma source based on helicon excitation operated at the Swiss Plasma Center at Ecole Polytechnique Fédérale de Lausanne. By operating in the visible range, which facilitates the recording of the spectrally resolved TS signal with a gated camera, this system has greatly enhanced the ability to characterize the plasmas generated by RAID in argon, helium, deuterium, and hydrogen. Parameter scans demonstrate good agreement with a Double Langmuir Probe (DLP) diagnostic, while highlighting the need for refinement of the DLP analysis routines in the presence of large magnetic fields. Detailed radial profiles of electron density and temperature are obtained in different working gases, in particular, in the challenging conditions of hydrogen, and can potentially provide new insights into helicon physics and plasma transport processes. This enhanced diagnostic capability establishes a solid foundation for future studies of helicon wave behavior, diagnostic development, and atomic physics investigations on RAID.
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