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Related Concept Videos

Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.

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Related Experiment Video

Updated: Jun 12, 2026

Super-resolution Imaging of the Cytokinetic Z Ring in Live Bacteria Using Fast 3D-Structured Illumination Microscopy (f3D-SIM)
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Region selective super-resolution imaging lithography for 3D via fabrication.

Dinghai Rui, LiBin Zhang, Zongyu Lei

    Optics Express
    |June 11, 2026
    PubMed
    Summary

    This study introduces a region-selective lithography method for 3D via fabrication using self-aligned surface plasmon excitation. The technique enables localized super-resolution imaging without precise alignment, simplifying nanofabrication processes.

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    Last Updated: Jun 12, 2026

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    Published on: September 8, 2017

    Area of Science:

    • Nanofabrication
    • Lithography
    • Plasmonics

    Background:

    • Conventional lithography struggles with precise 3D feature fabrication.
    • Existing plasmonic lithography methods often require nanometer-scale masks and critical alignment steps.

    Purpose of the Study:

    • To propose a region-selective super-resolution imaging lithography method for 3D via fabrication.
    • To enable localized plasmonic interference using self-aligned surface plasmon excitation.
    • To relax mask fabrication and alignment constraints in nanofabrication.

    Main Methods:

    • Utilizing micron-scale prepatterns to confine plasmonic interference.
    • Engineering a conformal vertical metal-dielectric multilayer stack for plasmonic cavity formation.
    • Employing finite-element method (FEM) and rigorous coupled-wave analysis (RCWA) for simulations.

    Main Results:

    • Achieved a minimum feature period of 50 nm (≈λ/17.4) at a 436 nm exposure wavelength.
    • Demonstrated stable and uniform interference fields within selective regions, suppressing out-of-area exposure.
    • Confirmed method robustness against variations in pre-pattern geometry and incident angles, maintaining high image contrast (0.75-0.8).

    Conclusions:

    • The proposed region-selective self-aligned plasmonic lithography offers a scalable route for high-aspect-ratio 3D nanofabrication.
    • This method simplifies fabrication by eliminating the need for nanometer-scale masks and precise alignment.
    • The technique provides enhanced control over localized super-resolution imaging for advanced 3D structures.