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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

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Related Experiment Video

Updated: Jun 16, 2026

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
07:50

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on: July 17, 2015

A single multi-configuration direct electron detector for various electron imaging and diffraction-based techniques

Nohayla El-Khairaoui1, Julien Guyon1, Nathalie Gey1

  • 1Université de Lorraine, CNRS, Arts et Métiers Institute of Technology, LEM3 F-57000 Metz, France.

Ultramicroscopy
|June 13, 2026
PubMed
Summary

A new multi-configuration detection system integrates a single direct electron detector (DED) in a scanning electron microscope (SEM). This enables multiple advanced microstructural characterizations, including Electron BackScatter Diffraction (EBSD) and Transmission Kikuchi Diffraction (TKD), without hardware changes.

Keywords:
EBSDECCIMaterials characterizationSTEM-in-SEMTKDTimepix3

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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

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Last Updated: Jun 16, 2026

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
07:50

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on: July 17, 2015

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Area of Science:

  • Materials Science
  • Crystallography
  • Electron Microscopy

Background:

  • Advanced materials require efficient multiscale crystallographic and defect analyses.
  • Current methods often necessitate multiple specialized setups for different analyses.
  • Integrated systems are needed for comprehensive material characterization.

Purpose of the Study:

  • To implement a novel multi-configuration detection system in a scanning electron microscope (SEM).
  • To integrate a single direct electron detector (DED) for diverse crystallographic and imaging techniques.
  • To enable seamless transitions between various diffraction and imaging modes without hardware modification.

Main Methods:

  • Integration of a Timepix3-based direct electron detector (DED) into a scanning electron microscope (SEM).
  • Utilizing precise translation and rotation movements for multi-configuration capabilities.
  • Developing custom post-processing approaches for electron data reconstruction and analysis.

Main Results:

  • Demonstrated capability to perform Electron BackScatter Diffraction (EBSD), Reflexion Kikuchi Diffraction (RKD), and Transmission Kikuchi Diffraction (TKD) with a single detector.
  • Achieved efficient reconstruction of electron images for BackScattered Electron imaging (BSE), Electron Channelling Contrast Imaging (ECCI), and Scanning Transmission Electron Imaging in SEM (STEM-in-SEM).
  • Acquired high-quality, indexable Kikuchi patterns and micrographs of dislocations in both reflection and transmission modes.

Conclusions:

  • A single DED, coupled with an orientable support in an SEM, can perform multiple advanced microstructural characterizations.
  • This integrated system enhances efficiency and versatility for analyzing both bulk samples and thin foils.
  • The developed system addresses the need for comprehensive and integrated crystallographic and defect analyses in advanced materials.