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Latifa Greche1, Nicolas Virlet2, Malcolm J Hawkesford3
1Crop Resource Use and Quality, Rothamsted Research, West Common, Harpenden, AL5 2JQ, UK. latifa.greche@rothamsted.ac.uk.
High-resolution 3D surface-scanning accurately quantifies wheat spike morphology, enabling precise phenotyping. This non-destructive method aids in linking wheat architecture to genetic potential and yield improvements.
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