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Related Experiment Video

Updated: Jun 17, 2026

Methods of Ex Situ and In Situ Investigations of Structural Transformations: The Case of Crystallization of Metallic Glasses

Methods of Ex Situ and In Situ Investigations of Structural Transformations: The Case of Crystallization of Metallic Glasses

Published on: June 7, 2018

In Situ Visualization via X-Ray Diffraction of Phase Transformations During Flash Lamp Annealing.

Cristian E Ruano Arens¹, Balreen Saini¹, Vivek Thampy²

¹Department of Materials Science and Engineering, Stanford University, Stanford, California, USA.

|June 16, 2026

Summary

This summary is machine-generated.

Flash lamp annealing (FLA) allows rapid, low-temperature processing of thin films. This study uses time-resolved X-ray diffraction to observe structural changes in ferroelectric materials during FLA with microsecond resolution.

Keywords:

ferroelectric hafnia flash lamp annealing (FLA)low thermal budget processing nanometer‐scale thin films synchrotron time‐resolved grazing‐incidence X‐ray Diffraction (GIXRD)ultrafast in situ structural transformation

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Published on: June 7, 2018

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Flash Infrared Annealing for Perovskite Solar Cell Processing

Flash Infrared Annealing for Perovskite Solar Cell Processing

Published on: February 3, 2021

Area of Science:

Materials Science
Condensed Matter Physics
Nanotechnology

Background:

Flash lamp annealing (FLA) offers rapid thermal processing but hinders direct observation of nanoscale thin film transformations.
Extreme heating/cooling rates in FLA complicate time-resolved temperature metrology and structural analysis.

Purpose of the Study:

To develop and demonstrate a method for time-resolved observation of structural evolution during FLA.
To investigate ultrafast crystallization and phase transformations in nanometer-scale thin films.

Main Methods:

Custom FLA system integrated with halogen lamp annealing.
Time-resolved synchrotron grazing-incidence X-ray diffraction (GIXRD) with 200 µs temporal resolution.
Simultaneous real-time surface temperature measurement and structural visualization.

Main Results:

Direct tracking of reversible/irreversible structural evolution during FLA.
Identification of two distinct timescales: rapid thermal relaxation and slower ferroelectric phase evolution.
Quantification of the thermal budget for ferroelectric phase induction, significantly lower than conventional annealing.

Conclusions:

The developed method enables direct, time-resolved observation of ultrafast processes in nanoscale thin films.
Provides a framework for studying pulsed thermal processing of materials for advanced technologies.
Achieved large remanent polarization (36 µC/cm²) in hafnia-based ferroelectrics with a low thermal budget.