Tao Chen1, Yage Yuan1, Jianan Wei2
1Key Laboratory of Advanced Manufacturing Technology, Ministry of Education, Guizhou University, Guiyang, Guizhou 550025, China.
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This study introduces an Adapted Oversampling-based Multi-layer Support Vector Machines (AM-SVMs) framework for intelligent fault diagnosis. AM-SVMs effectively handles imbalanced data, improving diagnostic accuracy and robustness in intelligent manufacturing.
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