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A Study on a Method for Detecting Surface Defects in Optical Modules Based on Information Entropy Feature Extraction
Longbing Yang1,2, Quan Xu1, Min Liao3
1School of Mechanical Engineering, Xihua University, Chengdu 610039, China.
Entropy (Basel, Switzerland)
|June 26, 2026
Summary
This study introduces a novel image processing method for optical module surface defect detection. It significantly improves detection rates and clarity, outperforming traditional methods without deep learning.
Area of Science:
- Optoelectronics
- Image Processing
- Artificial Intelligence Hardware
Background:
- Optical modules are critical for AI computing and digital communications, with rapidly growing demand.
- Current surface defect detection methods struggle with noise interference and low-contrast defects, leading to high false negative rates.
- Accurate and robust defect detection is essential for the mass production of optical modules.
Purpose of the Study:
- To develop a traditional image processing scheme for optical module surface defect detection that enhances accuracy and noise resistance.
- To address the limitations of existing methods in handling environmental noise and detecting low-contrast, minute defects.
- To provide a cost-effective and efficient solution suitable for large-scale mass production.
Main Methods:
- A novel detection scheme (WOMC) integrating information entropy constraints into traditional image processing.
- Noise suppression via entropy-weighted Hough transform during calibration.
- Contour localization using Canny edge detection and local entropy filtering.
- Defect recognition through Hu similarity matching and entropy difference verification.
Main Results:
- Achieved an average improvement of 35.77% in image clarity compared to traditional methods.
- Demonstrated a 2.25-fold increase in detection rate under Gaussian and salt-and-pepper noise.
- Reported high performance metrics: 96.67% accuracy, 97.32% recall, 3.31% false positive rate, and a 96.99% comprehensive performance score.
- Successfully detected low-contrast and minute defects with improved robustness.
Conclusions:
- The proposed WOMC method offers superior performance in optical module surface defect detection, particularly in noisy environments.
- This approach provides a viable, low-computing-cost alternative to deep learning models for mass production.
- The method is highly accurate, reliable, and suitable for the stringent requirements of industrial-scale manufacturing.
