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Development of a High-Frequency, High-Temperature Class-A Amplifier Based on a Silicon Carbide Static Induction
Maximilian C Scardelletti1, Jonathon R Grgat2, Christian A Zorman2
1Communications and Intelligent Design Division at NASA Glenn Research Center, Cleveland, OH 44135, USA.
None:
This paper reports the development of a Class-A amplifier that operates at 50 MHz and 400 °C. The amplifier utilizes a commercially available 4H-SiC static induction transistor (SIT) as the active device and incorporates input/output-matching networks to optimize amplifier operation and DC bias networks, which comprise thin-film spiral inductors, metal-insulator-metal (MIM) capacitors, and thick-film chip resistors. All passive components were tested at frequency and temperature prior to amplifier development and are reported. A small-signal SiC SIT model that was developed in Keysight's Advanced Design System (ADS 2023) software suite was used to design and optimize the amplifier's performance. The SiC SIT amplifier's S-parameters were recorded for frequencies between 20 and 100 MHz over a temperature range of 25 °C to 400 °C, exhibiting a gain (S21) of approximately 15.8 and 5.80 dB at 25 °C and 400 °C, respectively. The input and output reflection coefficients at 50 MHz and 400 °C were -18.5 and -15.2 dB, respectively. The noise figure and phase noise were measured at temperatures between 25 °C and 400 °C. At 50 MHz, the noise figure increased by only 21% over the temperature range, while the 1 kHz offset of the phase noise remained below -110 dBc/Hz. The stability factor, K, calculated using both measured and simulated data, demonstrates unconditional stability over the frequency range at 400 °C. Lastly, the 1 dB compression point was measured at 50 MHz and 400 °C with an approximated output of 9.5 dB. Simulated and measured results are presented and show the model is within 10% error at 400 °C.
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