Related Experiment Video
Updated: Jun 30, 2026

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
Anisotropic Unipolar Barrier Heterostructures with Semimetal Contacts for Polarization Detection and Computational
Chaojie Xia1,2, Shian Mi3, Xuhao Fan3
1Center for Micro/Nano Manufacturing and System Integration, Chongqing Institute of Green and Intelligent Technology of Chinese Academy of Sciences, Chongqing 400714, China.
Abstract:
Unipolar barrier architectures enable sensitive detection for computational imaging by blocking majority carriers while allowing efficient minority-carrier transport. However, their performance is often constrained by contact-interface transport limitations that suppress responsivity. Here, we demonstrate an anisotropic unipolar barrier detector based on a BP/MoS2/WTe2 van der Waals heterostructure. By incorporating semimetal WTe2 as the contact layer with a BP/MoS2 quasi-unipolar heterostructure, we engineer a robust architecture that synergizes low-resistance carrier extraction with the intrinsic anisotropy of the heterostructure. Crucially, by suppressing the isotropic dark current to prevent signal dilution, this design optimizes the signal-to-noise ratio for polarization-sensitive detection. At zero bias, the detector delivers a responsivity of about 128 mA/W, a specific detectivity of 3.4 × 1010 cm Hz1/2/W, and rise/fall times of 137/170 μs under 638 nm illumination, while achieving a polarization ratio of about 7.8 at 1550 nm. Furthermore, by integrating the device with a digital micromirror device for single-pixel computational imaging, we successfully reconstruct a high-contrast 8 × 8 "H" pattern, outperforming conventional large-area photoresistors. Beyond intensity imaging, the device also enables clear polarization imaging of <0.5 mm. Our findings underscore the significance of semimetal contact engineering in realizing high-sensitivity detection, paving the way for advanced unipolar barrier detectors in computational vision.
Related Concept Videos
Metal-Semiconductor Junctions
Schottky Barriers
Schottky barriers arise when a metal with a work function (Φm) contacts a semiconductor with a different work function (Φs). Initially, electrons transfer until the Fermi levels of the metal and semiconductor align at equilibrium. For instance, if Φm > Φs, the semiconductor Fermi level is higher than the metal's before contact. The semiconductor's...
Biasing of Metal-Semiconductor Junctions
In Schottky junctions, where the semiconductor is n-type, applying a positive voltage to the metal relative to the semiconductor reduces its Fermi...
Schottky Barrier Diode
Dielectric Polarization in a Capacitor

