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Updated: Jul 3, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Diffraction anomalous fine structure pinpoints electrochemically active sites in robust heterojunctions
Pengjun Zhang1, Guikai Zhang2, Ruijie Wang1
1National Synchrotron Radiation Laboratory, State Key Laboratory of Precision and Intelligent Chemistry, School of Nuclear Science and Technology, University of Science and Technology of China, Hefei 230029, Anhui, China.
Abstract:
Heterojunctions composed of identical metallic elements have intrinsic lattice-matching, tunable compositions, and low interfacial resistance, positioning them as promising candidates for electrochemical applications. However, constructing robust heterojunctions and correlating site chemistry remain challenging. Here, we present a highly durable Nb4CuC3/Nb4C3Tx heterostructure that exhibits outstanding cycling stability with virtually no capacity degradation over 10,000 cycles (5.0 amperes per gram) in lithium-ion batteries. Synchrotron radiation core-level spectroscopy and scanning transmission electron microscopy resolved four distinct niobium (Nb) coordination environments within the heterojunction. Critically, by integrating a site-selective x-ray analysis (diffraction anomalous fine structure) with complementary synchrotron techniques, it was pinpointed that the NbI sites on the Nb4C3Tx surface represent the true electrochemically active centers, while the Nb4CuC3 component primarily serves as structural buffer during cycling processes. This work establishes a versatile methodological platform for precisely identifying active sites within complex multisite structures during the working process, thus guiding the rational design of targeted active sites in heterogeneous electrochemical systems for high-performance energy storage.
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