Nitrogen-Incorporated Silicon Dioxide Interlayer Enables Pinhole-Reduced and Robust TOPCon With a High Implied

Zunke Liu1, Changqing Lin2, Yueying Zhang1

  • 1Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences (CAS), Ningbo, P. R. China.

Summary

Nitrogen incorporation into Tunnel Oxide Passivated Contact (TOPCon) solar cells creates a robust SiOxNy interlayer. This innovation enhances thermal stability and reduces defects, significantly boosting solar cell efficiency and performance.

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