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Updated: Jul 9, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Boyi Zeng1, Sijia Tang2, Nan Hu1
1College of Information Engineering, Hainan Vocational University of Science and Technology, HaiKou Hainan 571126, China. bingzheng10@163.com.
This study explores cold metals for reducing contact resistance in 2D devices. Four cold metals form stable n-type Ohmic contacts with NbGeN3, enabling efficient carrier injection and low-power electronics.
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