Electrochemical Systems
Biasing of Metal-Semiconductor Junctions
Interfacial Electrochemical Methods: Overview
Metal-Semiconductor Junctions
The Electrical Double Layer
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Updated: Jul 12, 2026

Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries
Published on: April 22, 2013
Haowei Yang1, Xiang Huang2, Zhe Zhang2
1School of Materials Science and Engineering, Central South University, Changsha, Hunan 410083, P.R. China.
Interfacial polarization in nitride optoelectronics is not an abrupt boundary but a delocalized charge. Indium incorporation in InGaN/GaN modifies this charge distribution, impacting device performance.
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