Eddy-Current-Induced Waveform Reconstruction by Metallic Probe Carriers in Magnetic Flux Leakage Inspection

Xiaoyuan Jiang1, Bohan Jia1, Yanhua Sun1

  • 1School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.

Summary

Metallic probe carriers in magnetic flux leakage (MFL) inspection actively alter sensor signals. This study reveals how conductive carriers cause waveform reconstruction, impacting MFL data interpretation and probe design.

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